[行业软件]Semiconductor Test System Development Software 20.0 [复制链接]

The software developer National Instruments is pleased to announce the availability of Semiconductor Test System Development Software 20.0 is a production-ready ATE solution for RF, mixed-signal, and MEMS semiconductor devices that helps improve time to market and lower the cost of test.

New Features - Date: April 2021
STS Development Software 20.0 adds the following major new features:

New Hardware Support

- PXIe-8881 controller — Added support for NI's new high-performance 8-Core Intel Xeon-based embedded controller.
- SCT SC2250 HMU — Added support for harmonic measurements through the STS RF subsystem (6 GHz STS for 5G configuration).
- PXIe-5820 — Added support for envelope tracking and baseband RF I/Q.
- PXIe-6594 — Added support for high-speed serial instrument, up to 16.3 Gbps.
- PXIe-4139 (40W) — Added support for high power (40W/10 A, Pulsed) SMU version.
- PXIe-5841 with STS-5531 — Added support for the PXIe-5841 Vector Signal Transceiver with STS-5531 as a 6 GHz, 1 GHz bandwidth, STS RF subsystem.
- PXIe-5831 + PXIe-5841 — Added support for the PXIe-5841 as a 44 GHz, 1 GHz bandwidth, STS mmWave subsystem with lower frequency IF.

New and Improved Test Program Development and Debugging

NI TestStand Semiconductor Module 2020 (TSM)
- TSM Sequence Call Step Type—Enables creation of customizable, reusable multistep IP parameter sequences.
- TSM Relay Configuration Step—Enables naming and recall of custom system relay configurations.
- NI-DCPower channel expansion—Enables aggregation of multiple SMU instrument sessions into a single session.
- NI-DCPower compliance alarms—Alerts the user when the state of an NI-DCPower instrument exceeds programmed limits.
- High-site-count operator interface—Provides enhanced operator interface (OI) options with optimizations for high-site-count DUT applications.
- Automated test program generation from a Digital Pattern Editor Project.
Digital Pattern Editor
- Automated DUT bring up/shutdown—Enables automation of DUT power sequencing and initialization patterns.
- Interactive continuity check—Verifies measurement connection paths to the DUT.
- Software-timed power sequencing—Provides user-defined DC power (DUT power) and digital pin power sequencing.
- Filtering items in the System View—User interface improvements with advanced filtering options for high-pin-count DUTs and high-site-count DUT applications.
- DUT register debug view—Quickly view the current DUT state and edit DUT registers with I2C, SPI, and MIPI RFFE protocols.
RF Steps and Tools
- .NET C# RF measurement steps and debugging tools for 5G NR, WiFi-6E, and mmWave applications
- Harmonics measurement support (HMU) through the STS RF subsystem (6 GHz STS for 5G configuration)
- S-Parameters measurement support for the following STS RF subsystem configurations (up to 8 GHz): 6 GHz STS for 5G and 8 GHz STS for WiFi-6E
- Noise figure measurement step (Y-factor method with synthetic noise source)
- Handler and prober driver support:
. (Improved) Accretech GPIB Prober Driver—Communicates with supported GPIB probers during test execution.
. (Improved) General GPIB Handler Driver—Communicates with supported GPIB handlers during test execution.
. (Improved) TEL GPIB Prober Driver—Communicates with supported TEL probers during test execution.
. (New) General TTL Handler Driver—Communicates with supported TTL handlers during test execution.

The NI Semiconductor Test System (STS) is a production ready ATE solution that can lower the cost of test and accelerate your time to market for increasingly analog semiconductor devices. Ranging from wafer test to packaged part test, this small-footprint tester enables multi-site testing with a high parallel test efficiency (PTE) and provides an innovative interactive debug experience. With several decades of experience developing software, the test program development is graphical, user-friendly, and is intuitive to work with. Built on lab-grade equipment, STS also enables yield optimization and increased quality.

What is the NI Semiconductor Test System (STS)?







Since 1976, National Instruments has equipped engineers and scientists with tools that accelerate productivity, innovation and discovery. NI’s graphical system design approach to engineering provides an integrated software and hardware platform that speeds the development of any system needing measurement and control. The company’s long-term vision and focus on improving society through its technology supports the success of its customers, employees, suppliers and shareholders.

Product: Semiconductor Test System Development Software
Version: 20.0
Supported Architectures: 32bit / 64bit
Website Home Page : www.ni.com
Languages Supported: english
System Requirements: PC *
Size: 23.8 Gb


* release info:


ni-sts-software_20.0.0_offline.iso
(MD5) 4027415174c9272ef25a20ad8cdc7a1a

Included Components
STS Development Software 20.0 includes the following major components:

- STS Development Software 20.0
- TestStand 2020
- NI TestStand Semiconductor Module 2020 (TSM)
- LabVIEW 2020 SP1
- LabVIEW 2020 SP1 Run-Time Engine
- NI-Digital Pattern Driver 20.6.1
- NI-DCPower 20.7.0
- NI-SCOPE 20.7.0
- NI-Sync 20.0.0
- NI-RFPM 20.6.0
- NI-RFmx 20.7.0
- NI-RFSA 20.7.0
- NI-RFSG 20.7.0
- STS Auxiliary Mixed Signal Tools 20.0.0
- STS Auxiliary RF Tools 20.0.0
- TSM RF Steps 20.0.0
- STS Handler and Prober Drivers 20.0.0
- STS Maintenance Software 20.0.0

** System Requirements:


System Requirements
STS Development Software 20.0 has the following requirements:
- 2.3 GHz 8-Core Intel Xeon processor (or equivalent)
- At least 100 GB of disk space
- At least 12 GB RAM (NI recommends 24 GB RAM)

Supported Controllers and Operating Systems
STS Development Software 20.0 supports the following controllers:
= PXIe-8880
= PXIe-8881
STS Development Software 20.0 supports the following operating system:
- Windows 10 IoT Enterprise LTSC 2019 (64-bit)

Note STS Development Software 20.0 does not support certain versions of Windows 10. Refer to Editions of Windows 10 Supported by NI Software for more information.

        

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